Programme
June, 29th
14.00-14.30 Registration
14.30-14.45 Welcome to participants and School program
14.45-18.30 Diffraction Methods for Residual Stress Analysis – Chairperson: P. Scardi
14.45-15.45 Introduction to X-ray Residual Stress Analysis, (P. Scardi, Univ. of Trento).
15.45-16.45 Neutron and X-ray synchrotron stress analysis
(M. Leoni, University of Trento)
16:45-17.00 coffee break
17.00-18.30 X-ray Diffraction Laboratory, (M. D’Incau e C.L. Azanza Ricardo, University of Trento)
June, 30th
9.00-10.00 Diffractometric techniques – Chairperson: M. Leoni
• X-ray Residual Stress Analysis Software: practical session, (M. Leoni, P. Scardi, University of Trento)
10.00-11.00 Blind Hole Drilling
• Blind Hole Drilling Method for the Residual Stress Profile Analysis, (E. Valentini – SINT Technologies, Prato)
11:00-11.30 coffee break
11.30-13.00 Electron Microscopy – Chairperson: S. Gialanella
• Strain effects in Electron Microscopy, (S. Frabboni – University of Modena and Reggio Emilia)
13:00-14:30 Lunch
14.30-16.00 Electron Microscopy – Chairperson: S. Gialanella
Strain Measurement with CBED, (R. Balboni – CNR-IMM Bologna)
16.00-16:30 coffe break
16:30-18:00 Strain effects in high resolution TEM Images
(V. Grillo – CNR-INFM S3 Modena)
20:30 Social Dinner
July, 1st
9:00-11:00 Raman spectroscopy – Chairperson: P. Scardi
9.00-11.00 Raman spectroscopy for stress analysis (M. Montagna, University of Trento)
11:00-11.30 coffee break
11.30 New trends in: Diffraction, Microscopy and Raman Spectroscopy – Chairperson: M. Montagna
11:30-12:00 Raman Spectroscopy: History and instrumentation development , (M. Placidi, HORIBA Jobin Yvon S.r.l, Opera (MI))
12:00-12:30 In situ micro X-ray tomography: a new frontier in electron microscopy, (M. Clementi – 2M Strumenti srl);
12:30-13:00 Innovative systems for residual stress measurement on complex surfaces (L. Seralessandri, GNR)
13:00-13:30 TEM Sample preparation using FIB, (A. Valdré – FEI Company)
13:30-14:30 Lunch + School picture
14:30 -18:00 Open Laboratory: Organisation of the lab sessions
XRD, SEM, TEM, RAMAN SPECTROSCOPY